DocumentCode :
1853583
Title :
Fully-digital testability of a high-speed conversion system
Author :
Vital, J.C. ; Franca, J.E. ; Silva, N.S.
Author_Institution :
Instituto Superior Tecnico
fYear :
1993
fDate :
3-6 May 1993
Firstpage :
1595
Lastpage :
1598
Keywords :
Circuit testing; Computer science; Dynamic range; Noise generators; Performance analysis; Performance evaluation; Signal resolution; Signal to noise ratio; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
Type :
conf
Filename :
692968
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1853583
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