Title :
Multiple error diagnosis in large combinational circuits using an efficient parallel vector simulation
Author :
Hsiao, Yu-Lin ; Wang, Chun-Yao ; Chen, Yung-Chih
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu
Abstract :
This paper presents a parallel vector simulation-based approach to locating multiple errors in large combinational circuits. Two heuristics are proposed to avoid the explosion of the error space. Experimental results on a set of ISCAS´85 and two large benchmarks show that our approach efficiently identifies a small set of correctable nodes that contains the actual error sources. Thus, further error correction can be conducted on the erroneous implementation.
Keywords :
circuit simulation; combinational circuits; digital simulation; fault diagnosis; optimisation; parallel processing; ISCAS´85; combinational circuits; error diagnosis; heuristics; parallel vector simulation; Boolean functions; Circuit simulation; Combinational circuits; Computational modeling; Computer errors; Computer simulation; Data structures; Error correction; Logic; Random number generation;
Conference_Titel :
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-1616-5
Electronic_ISBN :
978-1-4244-1617-2
DOI :
10.1109/VDAT.2008.4542424