Title :
Small-signal operation-based simplified verification of non-linear models for millimeter-wave electron devices
Author :
Raffo, A. ; Santarelli, A. ; Traverso, P.A. ; Vannini, G. ; Filicori, F.
Author_Institution :
Dept. of Eng., Ferrara Univ., Italy
Keywords :
MMIC; S-parameters; integrated circuit design; microwave field effect transistors; nonlinear network analysis; semiconductor device models; Y-parameters; bias voltages; dispersive phenomena; field effect transistors; intrinsic device ports; large-signal modeling; millimeter-wave electron devices; model extraction; model identification; nonlinear MMIC design; nonlinear models; semiconductor device characterization; Admittance measurement; Capacitance; Circuits; Electron devices; FETs; Impedance measurement; Particle measurements; Predictive models; Scattering parameters; Testing;
Conference_Titel :
ARFTG Conference Digest, 2005. Spring 2005. 65th
Print_ISBN :
0-7803-8858-5
DOI :
10.1109/ARFTGS.2005.1500584
