DocumentCode :
1853646
Title :
A clock and data recovery circuit with wide linear range frequency detector
Author :
Hsiao, Keng Jan ; Lee, Ming Hwa ; Lee, Tai Cheng
Author_Institution :
Electr. Eng. Dept., Nat. Taiwan Univ., Taipei
fYear :
2008
fDate :
23-25 April 2008
Firstpage :
121
Lastpage :
124
Abstract :
As the data rate increases above Gb/s, the design of a clock and data recovery (CDR) circuit becomes a great challenge. A 3.125-Gb/s CDR is proposed to shorten the frequency acquisition time by employing a wide-linear-range frequency detector. Fabricated in a 0.18-mum 1P6M CMOS technology, the output jitter of this proposed CDR is measured as 70 ps (peak-to-peak) and 8.3 ps (rms). The measured bit-error rate (BER) is less than 10-12 for 231-1 PRBS. The proposed CDR occupies a chip area of 0.61 mm times 0.61 mm and dissipates 61 mW from a single 1.8-V power supply.
Keywords :
CMOS integrated circuits; clocks; synchronisation; 1P6M CMOS technology; bit-error rate; clock recovery circuit; data recovery circuit; frequency acquisition time; output jitter; size 0.18 mum; voltage 1.8 V; wide-linear-range frequency detector; Bandwidth; Bit error rate; CMOS technology; Circuits; Clocks; Detectors; Frequency locked loops; Jitter; Power supplies; Semiconductor device measurement; Clock and Data recovery (CDR); frequency detector (FD);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-1616-5
Electronic_ISBN :
978-1-4244-1617-2
Type :
conf
DOI :
10.1109/VDAT.2008.4542427
Filename :
4542427
Link To Document :
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