Title :
Testing dynamic accuracy of vector network analyzers using the 40 GHz step attenuator
Author_Institution :
Anritsu Co., Morgan Hill, CA, USA
Keywords :
attenuators; network analysers; 40 GHz; NIST; dynamic accuracy testing; power linearity; step attenuators; test accuracy ratio; vector network analyzers; Attenuation measurement; Attenuators; Dynamic range; Electronic mail; Linearity; Measurement standards; Power measurement; Signal to noise ratio; Testing; Velocity measurement;
Conference_Titel :
ARFTG Conference Digest, 2005. Spring 2005. 65th
Print_ISBN :
0-7803-8858-5
DOI :
10.1109/ARFTGS.2005.1500585
