DocumentCode :
1853672
Title :
Failure analysis of NXN pads array using Anisotropic Conductive Films(ACF)
Author :
Lin, Chao-Ming
Author_Institution :
Grad. Sch. of Opto-Mechatron. & Mater., WuFeng Univ., Chiayi, Taiwan
Volume :
2
fYear :
2010
fDate :
1-3 Aug. 2010
Abstract :
This paper using V-shaped curve method with probability theory to calculate the nxn pads array failure probability of the Anisotropic Conductive Films Packaging. In the conductive (vertical) direction, the Poisson function is used to analyze the opening probability. In the insulation (pitch) direction, the generalized box model is used to analyze the bridging probability. The whole failure probability can be calculated by inclusion-exclusion principal. The results presented in this study suggest that the yield of the ACF package under great pads array number can be improved by decreasing the pad height or choosing the tip volume fraction.
Keywords :
Poisson equation; electronics packaging; failure analysis; flat panel displays; liquid crystal displays; probability; ACF packaging; NXN pads array failure probability; Poisson function; V-shaped curve method; anisotropic conductive films packaging; bridging probability; flat panel displays; generalized box model; inclusion-exclusion principal; liquid crystal displays; probability theory; tip volume fraction; Anisotropic conductive films; Arrays; Assembly; Integrated circuits; Packaging; Probability; Substrates; Poisson function; V-shaped curve method; anisotropic conductive film; failure probability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Information Engineering (ICEIE), 2010 International Conference On
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-7679-4
Electronic_ISBN :
978-1-4244-7681-7
Type :
conf
DOI :
10.1109/ICEIE.2010.5559794
Filename :
5559794
Link To Document :
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