DocumentCode
1853672
Title
Failure analysis of NXN pads array using Anisotropic Conductive Films(ACF)
Author
Lin, Chao-Ming
Author_Institution
Grad. Sch. of Opto-Mechatron. & Mater., WuFeng Univ., Chiayi, Taiwan
Volume
2
fYear
2010
fDate
1-3 Aug. 2010
Abstract
This paper using V-shaped curve method with probability theory to calculate the nxn pads array failure probability of the Anisotropic Conductive Films Packaging. In the conductive (vertical) direction, the Poisson function is used to analyze the opening probability. In the insulation (pitch) direction, the generalized box model is used to analyze the bridging probability. The whole failure probability can be calculated by inclusion-exclusion principal. The results presented in this study suggest that the yield of the ACF package under great pads array number can be improved by decreasing the pad height or choosing the tip volume fraction.
Keywords
Poisson equation; electronics packaging; failure analysis; flat panel displays; liquid crystal displays; probability; ACF packaging; NXN pads array failure probability; Poisson function; V-shaped curve method; anisotropic conductive films packaging; bridging probability; flat panel displays; generalized box model; inclusion-exclusion principal; liquid crystal displays; probability theory; tip volume fraction; Anisotropic conductive films; Arrays; Assembly; Integrated circuits; Packaging; Probability; Substrates; Poisson function; V-shaped curve method; anisotropic conductive film; failure probability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and Information Engineering (ICEIE), 2010 International Conference On
Conference_Location
Kyoto
Print_ISBN
978-1-4244-7679-4
Electronic_ISBN
978-1-4244-7681-7
Type
conf
DOI
10.1109/ICEIE.2010.5559794
Filename
5559794
Link To Document