Title :
Polarization-analyzing image sensor based on standard CMOS technology
Author :
Tokuda, T. ; Yamada, H. ; Sasagawa, K. ; Ohta, J.
Author_Institution :
Nara Inst. of Sci. & Technol., Ikoma, Japan
Abstract :
In this work, we propose and demonstrate a technology to realize polarization-analyzing CMOS image sensors. We developed a polarization-analyzing pixel with embedded polarizers. We characterize the performances of the sensor and demonstrate its functionality in polarimetric measurement of chiral solutions.
Keywords :
CMOS image sensors; optical polarisers; polarimetry; CMOS image sensor technology; embedded polarizer; polarimetric measurement; polarization-analyzing image sensor; CMOS image sensors; CMOS process; CMOS technology; Image sensors; Optical polarization; Photodiodes; Pixel; Sensor arrays; Sensor phenomena and characterization; Space technology; µTAS; CMOS image sensor; chiral measurement; polarimetric measurement; polarization;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
DOI :
10.1109/SENSOR.2009.5285497
