DocumentCode :
1853818
Title :
Towards built-in-self-test for SNR testing of a mixed-signal IC
Author :
Roberts, G.W.
fYear :
1993
fDate :
3-6 May 1993
Firstpage :
1599
Lastpage :
1602
Keywords :
Analog-digital conversion; Built-in self-test; Circuit testing; Costs; Integrated circuit testing; Manufacturing; Semiconductor device measurement; System testing; Test equipment; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
Type :
conf
Filename :
692969
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1853818
