Title :
Digital DC Resistance Tester
Author :
Chang, Tieyuan ; Zhang, Jingjing ; Chen, Wenjun
Author_Institution :
Coll. of Electron. & Inf. Eng., Hebei Univ., Baoding, China
Abstract :
This test method adopted the method of four-wire test to eliminate the influence of the lead resistance and the contact resistance effectively. And design the automatically selects the range of the circuit to measure the values of different resistance. We use two A/D converters to enlarge the values of voltage and current at the same time, and using software programming to realize the processing and displaying of the data.
Keywords :
DC amplifiers; analogue-digital conversion; automatic testing; contact resistance; network synthesis; A-D converters; contact resistance; digital DC resistance tester; four-wire test; lead resistance; precision instrumentation amplifier ICL7650; software programming; Circuit testing; Contact resistance; Current measurement; Educational institutions; Electric resistance; Electrical resistance measurement; Electronic equipment testing; Instruments; Strain measurement; Voltage; A/D transformation; Amplifier; MCS; small resistance;
Conference_Titel :
Future Networks, 2010. ICFN '10. Second International Conference on
Conference_Location :
Sanya, Hainan
Print_ISBN :
978-0-7695-3940-9
Electronic_ISBN :
978-1-4244-5667-3
DOI :
10.1109/ICFN.2010.54
