• DocumentCode
    1854110
  • Title

    A MEMS sensor for mean shear stress measurements in high-speed turbulent flows with backside interconnects

  • Author

    Grady, A.O. ; Larger, R. ; Tiliakos, N. ; Papadopoulos, G. ; Modi, V. ; Fréchette, L.G.

  • Author_Institution
    Mech. Eng. Dept., Columbia Univ., New York, NY, USA
  • fYear
    2009
  • fDate
    21-25 June 2009
  • Firstpage
    272
  • Lastpage
    275
  • Abstract
    A floating-element capacitive MEMS shear stress flow sensor was fabricated and shown to successfully measure mean-turbulent skin friction in high-speed compressible duct flow. The sensor was designed for harsh environments (e.g. high-temperature, high-shear stress) with novel through-substrate interconnects for robust packaging and remote circuitry for capacitance measurement. This paper extends our previous work on the MEMS shear stress sensor design and backside interconnect process development to provide complete device fabrication and testing in a high-speed flow.
  • Keywords
    capacitance measurement; microsensors; stress measurement; turbulence; MEMS sensor; MEMS shear stress sensor design; backside interconnect process development; capacitance measurement; device fabrication; device testing; floating-element capacitive MEMS shear stress flow sensor; harsh environment; high-speed compressible duct flow; high-speed turbulent flow; mean shear stress measurement; mean-turbulent skin friction; robust packaging; through-substrate interconnect; Capacitive sensors; Ducts; Fluid flow measurement; Friction; Integrated circuit interconnections; Micromechanical devices; Packaging; Robustness; Skin; Stress measurement; Capacitive Sensing; MEMS; Shear Stress; Skin Friction; Through Silicon Vias (TSV); Turbulence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
  • Conference_Location
    Denver, CO
  • Print_ISBN
    978-1-4244-4190-7
  • Electronic_ISBN
    978-1-4244-4193-8
  • Type

    conf

  • DOI
    10.1109/SENSOR.2009.5285510
  • Filename
    5285510