Title :
A high-resolution all-digital phase-locked loop with its application to built-in speed grading for memory
Author :
Hsu, Hsuan Jung ; Tu, Chun Chieh ; Huang, Shi Yu
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing-Hua Univ., Hsinchu
Abstract :
In this paper we present a high-resolution and wide-range all-digital phase-locked loop (ADPLL), which is suitable to function as a clock generator. The digitally controlled oscillator (DCO) is able to operate from 70 to 725 MHz and achieves 5.2ps resolution. The phase-frequency detector (PFD) is designed using a latch-based sense amplifier, leading to a nearly perfect PFD that is able to resolve a phase difference as minute as only 1ps. In addition, we use this ADPLL as a vehicle to perform built-in speed grading (BISG) for memory. Combining a binary search process with multiple runs of built-in self-test (BIST), the maximum operating speed can thus be tracked down on the chip with a high precision.
Keywords :
UHF oscillators; built-in self test; digital phase locked loops; phase detectors; BIST; PFD; all-digital phase-locked loop; binary search process; built-in self-test; built-in speed grading; clock generator; digitally controlled oscillator; frequency 70 MHz to 725 MHz; latch-based sense amplifier; phase-frequency detector; Circuits; Clocks; Delay; Digital control; Inverters; Oscillators; Phase detection; Phase frequency detector; Phase locked loops; Working environment noise;
Conference_Titel :
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-1616-5
Electronic_ISBN :
978-1-4244-1617-2
DOI :
10.1109/VDAT.2008.4542464