• DocumentCode
    1854389
  • Title

    A high-resolution all-digital phase-locked loop with its application to built-in speed grading for memory

  • Author

    Hsu, Hsuan Jung ; Tu, Chun Chieh ; Huang, Shi Yu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing-Hua Univ., Hsinchu
  • fYear
    2008
  • fDate
    23-25 April 2008
  • Firstpage
    267
  • Lastpage
    270
  • Abstract
    In this paper we present a high-resolution and wide-range all-digital phase-locked loop (ADPLL), which is suitable to function as a clock generator. The digitally controlled oscillator (DCO) is able to operate from 70 to 725 MHz and achieves 5.2ps resolution. The phase-frequency detector (PFD) is designed using a latch-based sense amplifier, leading to a nearly perfect PFD that is able to resolve a phase difference as minute as only 1ps. In addition, we use this ADPLL as a vehicle to perform built-in speed grading (BISG) for memory. Combining a binary search process with multiple runs of built-in self-test (BIST), the maximum operating speed can thus be tracked down on the chip with a high precision.
  • Keywords
    UHF oscillators; built-in self test; digital phase locked loops; phase detectors; BIST; PFD; all-digital phase-locked loop; binary search process; built-in self-test; built-in speed grading; clock generator; digitally controlled oscillator; frequency 70 MHz to 725 MHz; latch-based sense amplifier; phase-frequency detector; Circuits; Clocks; Delay; Digital control; Inverters; Oscillators; Phase detection; Phase frequency detector; Phase locked loops; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    978-1-4244-1616-5
  • Electronic_ISBN
    978-1-4244-1617-2
  • Type

    conf

  • DOI
    10.1109/VDAT.2008.4542464
  • Filename
    4542464