Title :
A symbolic approach for testability evaluation in fault diagnosis of nonlinear analog circuits
Author :
Fedi, G. ; Giomi, R. ; Manetti, S. ; Piccirilli, M.C.
Author_Institution :
Dept. of Electron. Eng., Florence Univ., Italy
fDate :
31 May-3 Jun 1998
Abstract :
A symbolic approach for testability evaluation in fault diagnosis of nonlinear analog circuits is presented. The new approach extends the methodologies developed for the linear case to circuits where nonlinear components, such as diodes or transistors, are present. The testability evaluation is a fundamental information for the fault diagnosis process, whatever method will be used, also in the nonlinear case. An example of circuit verifying this consideration and the validity of the proposed approach is briefly presented
Keywords :
analogue circuits; circuit testing; fault diagnosis; nonlinear network analysis; symbol manipulation; fault diagnosis; nonlinear analog circuit; symbolic analysis; testability; Analog circuits; Automatic testing; Circuit testing; Diodes; Electronic circuits; Electronic equipment testing; Fault diagnosis; Fault location; Linear circuits; Nonlinear equations;
Conference_Titel :
Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-4455-3
DOI :
10.1109/ISCAS.1998.705007
