An integrated analytic approach for reliability improvement [of weapons systems]

Author

Fortna, Harold C. ; Zavada, Raymond ; Warren, Teresa M.

Author_Institution

Anal. Sci. Corp., Reading, MA, USA

fYear

1990

fDate

23-25 Jan 1990

Firstpage

192

Lastpage

199

Abstract

Repair data from MK12 Phalanx close-in weapon system (CIWS) depots were analyzed by component removal locations on the 13 highest-failure circuit card assemblies (CCAs). This analysis showed several clusters on the mode-system-control CCA that were believed to be caused by high temperature. With a finite-difference technique, a thermal model of these clustered areas was devised, and it verified that the resistors were operating in their upper temperature range. To assure that the analysis was reasonable, a training CIWS was wired with the thermocouples and operated. The testing verified that the analysis was reasonable and could be used to determine the effect of circuit changes on the temperature profile of this CCA. Recommendations were made to reduce the heat generated in the cluster or to increase the airflow in the region of the CCA. An estimate of potential cost savings provided the final information needed by management to decide how to proceed

Keywords

difference equations; failure analysis; life testing; military equipment; reliability; weapons; CIWS; MK12 Phalanx close-in weapon system; circuit card assemblies; circuit testing; finite-difference technique; maintenance; reliability improvement; resistors; temperature profile; thermal model; Assembly systems; Circuit testing; Costs; Finite difference methods; Information management; Integrated circuit reliability; Resistors; Temperature distribution; Thermal resistance; Weapons;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability and Maintainability Symposium, 1990. Proceedings., Annual

Conference_Location

Los Angeles, CA

Type

conf

DOI

10.1109/ARMS.1990.67955

Filename

67955