DocumentCode :
1854746
Title :
Fractal characteristics of dielectric breakdown
Author :
Vicente, J.L. ; Razzitte, A.C. ; Mola, E.E.
Author_Institution :
Div. Quimica Teorica, INIFTA, La Plata, Argentina
fYear :
1994
fDate :
23-26 Oct 1994
Firstpage :
524
Lastpage :
531
Abstract :
Wiessman and Zeller (WZ, 1986) applied a simple two-dimensional stochastic model in order to apply it to the stepwise propagation of those damage structures known as electrical trees. These branching structures propagate by the repeated extension of the individual tips of damage channels and they have fractal characteristics similar to those observed experimentally in solid dielectrics under alternating voltage excitation. Barclay, Sweeney, Dissado and Stevens (BSDS, 1990) explored critically the fractal character of the simulated electrical trees by using the WZ model. In this paper we will essentially adopt the BSDS model to explore the fractal character of electrical trees by using a different tree growing simulation process as that proposed by those authors
Keywords :
electric breakdown; alternating voltage excitation; damage structures; dielectric breakdown; electrical trees; fractal characteristics; simulation; solid dielectrics; two-dimensional stochastic model; Bonding; Dielectric breakdown; Electric potential; Electrodes; Fractals; Laplace equations; Lattices; Nearest neighbor searches; Stochastic processes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
Type :
conf
DOI :
10.1109/CEIDP.1994.592025
Filename :
592025
Link To Document :
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