DocumentCode :
1854804
Title :
A novel method for wire fault location using reflectometry and iterative deconvolution
Author :
Qinghai Shi ; Kanoun, Olfa
Author_Institution :
Meas. & Sensor Technol., Chemnitz Univ. of Technol., Chemnitz, Germany
Volume :
3
fYear :
2012
fDate :
21-25 Oct. 2012
Firstpage :
2139
Lastpage :
2143
Abstract :
The novelty of this paper is to propose an efficient method for the detection and location of wiring faults with transfer function analysis using time domain reflectometry (TDR), iterative deconvolution and optimization techniques. The paper shows how iterative deconvolution and optimization techniques are used to locate hard faults, small discontinuities and enhance the signal-to-noise ratio. The developed method can also be applied to characterize the wire faults in the branches of the network. The adaptive filters are applied to reduce the deconvolution noise. The performance of three frequency domain deconvolution techniques, the short window function, the optimum compensation and the automated-regularization technique are applied to solve the ill-posed inverse problem for the transfer function between incident and reflected waves. The proposed approach was applied to locate faults on the shielded coaxial cables and twisted pair cables.
Keywords :
adaptive filters; coaxial cables; inverse problems; iterative methods; optimisation; time-domain analysis; transfer functions; twisted pair cables; TDR; adaptive filters; automated-regularization technique; deconvolution noise reduction; ill-posed inverse problem; incident waves; iterative deconvolution; optimization techniques; reflected waves; shielded coaxial cables; short window function; signal-to-noise ratio; time domain reflectometry; transfer function analysis; twisted pair cables; wire fault location; iterative deconvolution; optimization criteria; reflected waves; time domain reflectometry; trasfer function between incident; wire faults location;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing (ICSP), 2012 IEEE 11th International Conference on
Conference_Location :
Beijing
ISSN :
2164-5221
Print_ISBN :
978-1-4673-2196-9
Type :
conf
DOI :
10.1109/ICoSP.2012.6492004
Filename :
6492004
Link To Document :
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