Title :
Progress in the development of high-conversion-efficiency a-Si/μc-Si tandem solar module using μc-Si thin film with high deposition rate on Gen. 5.5 large-area glass substrate
Author :
Aya, Youichirou ; Katayama, Hirotaka ; Matsumoto, Mitsuhiro ; Hishida, Mitsuoki ; Shinohara, Wataru ; Yoshida, Isao ; Kitahara, Akinao ; Yoneda, Haruki ; Terakawa, Akira ; Iseki, Masahiro
Author_Institution :
Adv. Photovoltaic Dev. Center, Sanyo Electr. Co. Ltd., Gifu, Japan
Abstract :
The technology to make high-quality, high-reliability solar modules with a high deposition rate for μc-Si thin-film is a problem for the industrialization of low-cost, high-conversion-efficiency a-Si/μc-Si tandem structure solar modules. Sanyo has solved this problem by developing an original CVD technique called Localized Plasma Confinement CVD and a new evaluation method for μc-Si thin film. A stabilized conversion efficiency of 10.0% was achieved for an a-Si/μc-Si tandem structure solar module, and a deposition rate of 2.4 nm/s for μc-Si thin-film was attained on a Gen. 5.5 full-size glass substrate. To obtain a higher conversion-efficiency a-Si/μc-Si tandem structure solar module, fundamental studies of μc-Si thin-film have been performed, and a stabilized conversion efficiency of 10.5% (Initial solar module conversion efficiency: 12.0%) has been achieved on a large-area glass substrate. Furthermore, in the study of this development, the highest stabilized conversion efficiency of 12.0% (Initial conversion-efficiency: 13.5%) was attained. Module reliability tests confirmed by IEC 61646 Ed. 2 revealed that the performance of the module is adapted. These high-performance a-Si/μc-Si tandem structure solar modules were prepared by using the knowledge of our thin-film and module technologies.
Keywords :
IEC standards; amorphous semiconductors; elemental semiconductors; plasma CVD; reliability; semiconductor growth; semiconductor thin films; silicon; solar cells; Gen. 5.5 full-size glass substrate; Gen. 5.5 large-area glass substrate; IEC 61646 Ed. 2; Si-Si; deposition rate; high quality solar module; high reliability solar module; high-conversion-efficiency a-Si-μc-Si tandem solar module; localized plasma confinement CVD technique; microcrystalline-Si thin film; module reliability test; stabilized conversion efficiency; Cathodes; Glass; IEC standards; Photovoltaic cells; Plasmas; Substrates;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6185919