Title :
Computation with simultaneously concurrent error detection using bi-directional operands
Author :
Chen, L.G. ; Chen, T.-H.
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
A novel method of computation with simultaneously concurrent error detection using bidirectional operands (BIDO) is presented. This technique will provide an efficient and optimal design for an arithmetic unit with fault tolerance. The technique retains all the capabilities of the space redundancy and time redundancy methods, but does not inherit their drawbacks. BIDO requires less hardware overhead than RESO techniques and hardly any redundant time. These capabilities and features make BIDO better suited for designing arithmetic units of VLSI systems, which require high performance and high reliability
Keywords :
VLSI; circuit reliability; digital arithmetic; error detection; VLSI systems; arithmetic unit; bi-directional operands; fault tolerance; optimal design; redundant time; reliability; simultaneously concurrent error detection; Arithmetic; Bidirectional control; Birth disorders; Concurrent computing; Fault tolerance; Hardware; Parallel processing; Redundancy; Throughput; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1989. ICCD '89. Proceedings., 1989 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-1971-6
DOI :
10.1109/ICCD.1989.63342