On using IEEE 1500 standard for functional testing

Author

Ali, Ghazanfar ; Hussin, Fawnizu Azmadi ; Ali, Noohul Basheer Zain ; Hamid, Nor Hisham

Author_Institution

Electr. & Electron. Eng. Dept., Univ. Teknol. Petronas, Tronoh, Malaysia

fYear

2013

fDate

26-28 Aug. 2013

Firstpage

39

Lastpage

46

Abstract

In core based design (i.e. System on Chip) testing, IEEE 1500 standard has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in the functional mode. In this paper, a proposed method to enhance the IEEE 1500 standard for functional testing in order to increase observability during functional test is discussed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on SAYEH processor in order to test it using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the modification to the IEEE 1500 standard enables it to be used for functional testing, with increased observability.

Keywords

IEEE standards; electronic engineering computing; logic design; logic testing; system-on-chip; IEEE 1500 standard; SAYEH processor; SBST technique; core based design; embedded software based self-testing; functional testing; system-on-chip testing; Observability; Shift registers; Standards; System-on-chip; Testing; Vectors; Functional Testing; IEEE 1500 Standard; SBST;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality Electronic Design (ASQED), 2013 5th Asia Symposium on

Conference_Location

Penang

Print_ISBN

978-1-4799-1312-1

Type

conf

DOI

10.1109/ASQED.2013.6643561

Filename

6643561