DocumentCode
1855587
Title
Cu2 ZnSnS4 (CZTS) thin films grown by sulfurization of different precursor layers in sulfur atomsphere
Author
Chalapathy, R.B.V. ; Lee, Chang-Soo ; Ahn, Byung Tae
Author_Institution
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear
2011
fDate
19-24 June 2011
Abstract
Cu2ZnSnS4 (CZTS) thin films have been grown by two step process. Two different precursors; one is stacked layer consists of Cu/ZnSn/Cu and the other one is single layer from an alloy target of Cu-Zn-Sn were deposited onto Mo coated soda lime glass substrates kept at RT by Dc sputtering. The precursor layers were converted into CZTS films by annealing at 560°C for 6 min in sulfur atmosphere. The XRD pattern of the stacked precursor layer consists of Cu3Sn, CuZn, Cu6Sn5, Sn phases suggests that Cu diffuses into the ZnSn during the precursor deposition and forms binary phases. CZTS films grown with stacked precursors were single phase Kesterite with (112) orientation. The films exhibited dense morphology with submicron grain sizes and fine grains at the interface between CZTS and Mo. On the other hand the precursor grown with Cu poor and Zn rich alloy target showed peaks of corresponding to binary metallic phase Cu6Sn5. The CZTS films obtained at 560°C for 6 min showed non uniform surface with voids. The cross-sectional morphology of the films shows dense columnar grains. The solar cells fabricated with these films showed no performance due to porous and inhomogeneous surface morphology. We found that the CZTS films grown with stacked precursor layers deposited with Cu and ZnSn targets have shown better properties. Solar cells fabricated with this CZTS absorber showed an efficiency of 4.7% with an open circuit voltage of 632 mV, a short circuit current density of 15.80 mA/cm2 and fill factor 47.13% for an area of 0.44 cm2.
Keywords
X-ray diffraction; copper compounds; semiconductor growth; semiconductor thin films; solar cells; sputtering; surge protection; tin compounds; zinc compounds; Cu2ZnSnS4; Dc sputtering; XRD pattern; annealing; dense morphology; different precursor layers; lime glass substrates; submicron grain sizes; sulfur atmosphere; sulfurization; temperature 560 degC; thin films grown; time 6 min; two step process; Copper; Films; Morphology; Photovoltaic cells; Surface morphology; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location
Seattle, WA
ISSN
0160-8371
Print_ISBN
978-1-4244-9966-3
Type
conf
DOI
10.1109/PVSC.2011.6185942
Filename
6185942
Link To Document