Title :
Contact resistance of local rear side contacts of screen-printed silicon PERC solar cells with efficiencies up to 19.4%
Author :
Gatz, Sebastian ; Dullweber, Thorsten ; Brendel, Rolf
Author_Institution :
Inst. for Solar Energy Res. Hamelin (ISFH), Emmerthal, Germany
Abstract :
Summary form only given. We demonstrate industrially feasible large-area solar cells with passivated homogenous emitter and rear achieving energy conversion efficiencies of up to 19.4 % on 125×125 mm2 p-type 2-3 Ωcm boron-doped Czochralski silicon wafers. Front and rear metal contacts are fabricated by screen-printing of silver and aluminum paste and firing in a conventional belt furnace. We implement three different dielectric rear surface passivation stacks. The dielectrics at the rear result in a decreased surface recombination velocity of down to Srear = 70 cm/s, and an increased internal IR reflectance of up to 91 % corresponding to an improved Jsc of up to 38.9 mA/cm2. We observe an increase in cell efficiency from 18.7 % for the best full-area Al-BSF reference cell up to 19.4 % for the PERC solar cell. To our knowledge, the energy conversion efficiency of 19.4 % is the best value reported so far for large area screen-printed solar cells. However, these cells suffer from a moderate fill factor below 76 % due to an increased series resistance. We investigate different rear metallization fractions by varying the pitch and the width of the local line contacts. The solar cell analysis reveals a significant contribution of the local rear contacts to the total series resistance. By fitting of the experimental data with an analytical model we deduce a specific contact resistance of screen-printed local aluminum rear contacts of (55 ± 10) m Ωcm2.
Keywords :
boron; contact resistance; crystal growth from melt; direct energy conversion; elemental semiconductors; firing (materials); passivation; reflectivity; semiconductor device metallisation; silicon; solar cells; surface recombination; Ag-Si:B; Al-Si:B; belt furnace; boron-doped Czochralski silicon wafers; cell efficiency; contact resistance; dielectric rear surface passivation stacks; energy conversion efficiencies; energy conversion efficiency; full-area Al-BSF reference cell; homogenous emitter passivation; internal IR reflectance; local line contacts; local rear side contacts; metal contacts; metallization fractions; screen-printed local aluminum rear contacts; screen-printed silicon PERC solar cells; series resistance; surface recombination velocity; Aluminum; Contact resistance; Dielectrics; Photovoltaic cells; Resistance; Solar energy;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6185943