DocumentCode
1855820
Title
A structured approach to improving software-reliability using operational profiles
Author
Pant, Himanshu ; Franklin, Paul ; Everett, William
Author_Institution
AT&T Bell Labs., Holmdel, NJ, USA
fYear
1994
fDate
24-27Jan 1994
Firstpage
142
Lastpage
146
Abstract
To ensure high reliability software products it is necessary to test the software in all aspects of its usage. However, economic constraints preclude the possibility of exhaustive testing thus necessitating the allocation of testing resources based on the frequency of usage of the features/functions being tested. The operational profile is a recognized method of capturing software usage information. In this paper a method for developing the operational profile for interactive users of a software program is explained. This work shows how to use a technique which is easily taught to software developers; the method provides value to software development staff in the following ways: Rapid development of an operational profile; Increased understanding of how the product supports the work required by the product specification; Selection of test cases using software tools; Selection of test cases based on the usage frequency of the function/feature. The method is illustrated with an example that also shows the use of a test case selection tool that facilitates the testers task by using as input information that has already been obtained while developing the operational profile
Keywords
software reliability; software tools; frequency of usage; interactive users; operational profiles; product specification; software program; software reliability; software tools; software usage information; testing resources; Environmental economics; Frequency; Programming; Radio spectrum management; Reliability engineering; Resource management; Software reliability; Software testing; Software tools; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1994. Proceedings., Annual
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-1786-6
Type
conf
DOI
10.1109/RAMS.1994.291097
Filename
291097
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