DocumentCode :
1855873
Title :
Temperature dependence of magnetic domain structures of Co particles fabricated by electron beam lithography
Author :
Kageyama, Yasuyuki ; Suzuki, Takao
Author_Institution :
Inf. Storage Mater. Lab., Toyota Technol. Inst., Nagoya, Japan
fYear :
2005
fDate :
11-15 July 2005
Firstpage :
23
Abstract :
Submicron-sized Co particles were fabricated by patterning single crystal Co thin films, and their magnetic domain structures were observed by magnetic force microscopy (MFM) with temperature up to 200 °C. The Co films (220 nm in thickness) were epitaxially deposited onto Al2O3 [001] single-crystal substrates by electron beam evaporation, and from these films (with their c-axis parallel to the surface normal) circular dots with diameters of 0.5, 1, and 2.5 μm were patterned by electron beam lithography and Ar ion beam etching. Maze patterns in domain structure were clearly observed in all types of dots. MFM images taken at elevated temperatures did not show prominent change in the domain pattern, which implies stability of Co magnetization up to this temperature. Landau-Lifshitz-Gilbert (LLG) simulation results showed good agreement with these experimental data, and also predicted that a vortex structure will be obtained with thinner (50 nm) dots at 200 °C.
Keywords :
cobalt; electron beam deposition; electron beam lithography; etching; ion beam effects; magnetic domains; magnetic force microscopy; metallic thin films; vortices; 0.5 nm; 1 nm; 2.5 nm; 200 C; 220 nm; Al2O3; Al2O3 [001] single-crystal substrate; Ar ion beam etching; Co; Co thin film; Landau-Lifshitz-Gilbert simulation; circular dots; electron beam evaporation; electron beam lithography; magnetic domain structure; magnetic force microscopy; magnetization; submicron-sized Co particles; vortex structure; Argon; Electron beams; Ion beams; Lithography; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetic forces; Substrates; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
Type :
conf
DOI :
10.1109/NANO.2005.1500682
Filename :
1500682
Link To Document :
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