DocumentCode
1856002
Title
Selective electrochemical release etching of eutectically bonded microstructures
Author
Gradin, H. ; Braun, S. ; Sterner, M. ; Stemme, G. ; van der Wijngaart, W.
Author_Institution
Microsyst. Technol. Lab., KTH - R. Inst. of Technol., Stockholm, Sweden
fYear
2009
fDate
21-25 June 2009
Firstpage
743
Lastpage
746
Abstract
This paper reports on the successful demonstration of a novel microfabrication method in which eutectic gold bonded microstructures are selectively electrochemically release etched. This method offers several advantages: both a strong permanent bond and a temporary bond is achieved on the same die, the footprint of the temporary bonded structures is allowed to be larger than the footprint of the permanently bonded structures and the used etchants provide a larger process compatibility than the etchants of other release etch methods. Eutectically bonded 350 mum wide silicon structures were fully released after 1 hour of electrochemical etching followed by 1.5 hours wet etching of the TiW adhesion layer.
Keywords
adhesion; electrochemistry; etching; eutectic structure; gold; microfabrication; micromechanical devices; silicon; wafer bonding; Si; TiW adhesion layer; etchants; eutectic gold bonded microstructures; microfabrication; permanent bond; selective electrochemical release etching; silicon; size 350 mum; temporary bond; time 1.5 h; wafer bonding; wet etching; Adhesives; Fabrication; Gold; Laser ablation; Micromechanical devices; Microstructure; Polymers; Silicon; Wafer bonding; Wet etching; Wafer bonding; electrochemical etching; eutectic bonding; release etching; selective etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location
Denver, CO
Print_ISBN
978-1-4244-4190-7
Electronic_ISBN
978-1-4244-4193-8
Type
conf
DOI
10.1109/SENSOR.2009.5285586
Filename
5285586
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