DocumentCode
1856114
Title
A practical timing-risk analysis method
Author
Koo, David Y.
Author_Institution
Westinghouse Electr. Corp., Baltimore, MD, USA
fYear
1994
fDate
24-27Jan 1994
Firstpage
210
Lastpage
215
Abstract
This paper introduces a simple, practical, and less biased statistical method which can quickly estimate the probability of a circuit failure due to the tolerance buildup of propagation delays. The basic statistical analysis method can be used by a reliability analyst for worst case analysis (WCA). It can help designers to understand the statistical nature of the propagation delay timing problem. Most important of all it can arouse government/industry´s attention that IC propagation delay specifications should be regulated so that the digital circuit design can be improved and the method of WCA can be standardized. The improved methods may be used to predict the inherent reliability of a circuit. Since the Mil-HDBK-217 can only predict the operational reliability of a circuit, the final circuit reliability should be the product of both types of reliability predictions
Keywords
circuit reliability; delays; failure analysis; probability; statistical analysis; IC propagation delay; Mil-HDBK-217; circuit failure prediction; circuit reliability; digital circuit; probability; propagation delay timing; statistical method; timing-risk analysis; worst case analysis; Delay effects; Delay estimation; Equations; Failure analysis; Gaussian distribution; Integrated circuit modeling; Integrated circuit testing; Moment methods; Propagation delay; Risk analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1994. Proceedings., Annual
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-1786-6
Type
conf
DOI
10.1109/RAMS.1994.291110
Filename
291110
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