• DocumentCode
    1856114
  • Title

    A practical timing-risk analysis method

  • Author

    Koo, David Y.

  • Author_Institution
    Westinghouse Electr. Corp., Baltimore, MD, USA
  • fYear
    1994
  • fDate
    24-27Jan 1994
  • Firstpage
    210
  • Lastpage
    215
  • Abstract
    This paper introduces a simple, practical, and less biased statistical method which can quickly estimate the probability of a circuit failure due to the tolerance buildup of propagation delays. The basic statistical analysis method can be used by a reliability analyst for worst case analysis (WCA). It can help designers to understand the statistical nature of the propagation delay timing problem. Most important of all it can arouse government/industry´s attention that IC propagation delay specifications should be regulated so that the digital circuit design can be improved and the method of WCA can be standardized. The improved methods may be used to predict the inherent reliability of a circuit. Since the Mil-HDBK-217 can only predict the operational reliability of a circuit, the final circuit reliability should be the product of both types of reliability predictions
  • Keywords
    circuit reliability; delays; failure analysis; probability; statistical analysis; IC propagation delay; Mil-HDBK-217; circuit failure prediction; circuit reliability; digital circuit; probability; propagation delay timing; statistical method; timing-risk analysis; worst case analysis; Delay effects; Delay estimation; Equations; Failure analysis; Gaussian distribution; Integrated circuit modeling; Integrated circuit testing; Moment methods; Propagation delay; Risk analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1994. Proceedings., Annual
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1786-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1994.291110
  • Filename
    291110