DocumentCode
1856144
Title
An electrical study of differential clock die-to-die interconnection in multi-chip packages
Author
Tang Min Keen ; Tan Wei Jern
Author_Institution
Chipset & SOC Group, Intel Corp., Nibong Tebal, Malaysia
fYear
2013
fDate
26-28 Aug. 2013
Firstpage
196
Lastpage
199
Abstract
This paper presents an electrical study on die-to-die interconnect, differential clock signals in MCPs. The paper seeks to tackle the issues caused by shorter and denser interconnection in combination with an ever-decreasing z-height profile. The proposed methods focus on buffer and channel design on existing or new signaling. Of note, they maintain a fair amount of design flexibility, while not jeopardizing overall margins. The methods primarily mitigate harmful ringing, ledge effects and excessively slow slew rates in the monotonic region in both MCP and discrete solutions. Ultimately, this translates into a shift in line with recent platforms´ sleek and thin form factor and in turn, a cost saving benefit.
Keywords
clocks; interconnections; multichip modules; MCP; channel design; differential clock die-to-die interconnection; differential clock signals; multichip packages; z-height profile; Capacitance; Clocks; Crosstalk; Impedance; Microstrip; Power transmission lines; Reflection; buffer design; channel margin improvement; die-to-die interconnection; ledges and ringing mitigation;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ASQED), 2013 5th Asia Symposium on
Conference_Location
Penang
Print_ISBN
978-1-4799-1312-1
Type
conf
DOI
10.1109/ASQED.2013.6643587
Filename
6643587
Link To Document