• DocumentCode
    1856144
  • Title

    An electrical study of differential clock die-to-die interconnection in multi-chip packages

  • Author

    Tang Min Keen ; Tan Wei Jern

  • Author_Institution
    Chipset & SOC Group, Intel Corp., Nibong Tebal, Malaysia
  • fYear
    2013
  • fDate
    26-28 Aug. 2013
  • Firstpage
    196
  • Lastpage
    199
  • Abstract
    This paper presents an electrical study on die-to-die interconnect, differential clock signals in MCPs. The paper seeks to tackle the issues caused by shorter and denser interconnection in combination with an ever-decreasing z-height profile. The proposed methods focus on buffer and channel design on existing or new signaling. Of note, they maintain a fair amount of design flexibility, while not jeopardizing overall margins. The methods primarily mitigate harmful ringing, ledge effects and excessively slow slew rates in the monotonic region in both MCP and discrete solutions. Ultimately, this translates into a shift in line with recent platforms´ sleek and thin form factor and in turn, a cost saving benefit.
  • Keywords
    clocks; interconnections; multichip modules; MCP; channel design; differential clock die-to-die interconnection; differential clock signals; multichip packages; z-height profile; Capacitance; Clocks; Crosstalk; Impedance; Microstrip; Power transmission lines; Reflection; buffer design; channel margin improvement; die-to-die interconnection; ledges and ringing mitigation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ASQED), 2013 5th Asia Symposium on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4799-1312-1
  • Type

    conf

  • DOI
    10.1109/ASQED.2013.6643587
  • Filename
    6643587