DocumentCode
1856199
Title
A framework for systematic benchmarking of monitoring and diagnostic systems
Author
Kurtoglu, TaIga ; Mengshoel, Ole J. ; Poll, Scott
Author_Institution
Mission Critical Technol./NASA Ames Res. Center, Ames, IA
fYear
2008
fDate
6-9 Oct. 2008
Firstpage
1
Lastpage
13
Abstract
In this paper, we present an architecture and a formal framework to be used for systematic benchmarking of monitoring and diagnostic systems and for producing comparable performance assessments of different diagnostic technologies. The framework defines a number of standardized specifications, which include a fault catalog, a library of modular test scenarios, and a common protocol for gathering and processing diagnostic data. At the center of the framework are 13 benchmarking metric definitions. The calculation of metrics is illustrated on a probabilistic model-based diagnosis algorithm utilizing Bayesian reasoning techniques. The diagnosed system is a real-world electrical power system, namely the Advanced Diagnostics and Prognostics Testbed (ADAPT) developed and located at the NASA Ames Research Center. The proposed benchmarking approach shows how to generate realistic diagnostic data sets for large-scale, complex engineering systems, and how the generated experimental data can be used to enable ldquoapples to applesrdquo assessments of the effectiveness of different diagnostic and monitoring algorithms.
Keywords
computerised monitoring; fault location; fault tolerant computing; Bayesian reasoning technique; advanced diagnostics; benchmarking metric definition; complex engineering systems; diagnostic algorithm; diagnostic system; diagnostic technology; fault catalog; formal framework; modular test scenarios; monitoring algorithm; monitoring system; probabilistic model-based diagnosis algorithm; prognostics testbed; realistic diagnostic data sets; standardized specifications; systematic benchmarking; Bayesian methods; Benchmark testing; Data engineering; Large-scale systems; Libraries; Monitoring; NASA; Power system modeling; Protocols; System testing; Bayesian Reasoning; Fault Detection; Fault Diagnosis; Model-Based Diagnosis; Systems Health Management;
fLanguage
English
Publisher
ieee
Conference_Titel
Prognostics and Health Management, 2008. PHM 2008. International Conference on
Conference_Location
Denver, CO
Print_ISBN
978-1-4244-1935-7
Electronic_ISBN
978-1-4244-1936-4
Type
conf
DOI
10.1109/PHM.2008.4711454
Filename
4711454
Link To Document