• DocumentCode
    1856202
  • Title

    Scaled measurements of mode-stirred HIRF penetration into an aircraft fuselage

  • Author

    Birtcher, C.R. ; Panaretos, A.H. ; Balanis, C.A.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    4
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    755
  • Abstract
    HIRF stands for high intensity radiated fields, and includes all man-made sources of electromagnetic energy. Certification is necessary to ensure that on-board electronics are sufficiently hardened to withstand all likely electromagnetic threats without upsets. HIRF certification involves two steps. First, the fields local to the on-board electronic systems that have penetrated into the fuselage are predicted using numerical methods for the anticipated incident HIRF fields. Then, the electronics systems can be monitored for upsets while being subjected to those same local fields in the laboratory. In this paper, measurements of the electric field penetration into a scaled fuselage-like body were performed at four different locations as a function of mode stirrer orientation for over 10,000 frequencies. These measurements will be used to validate FDTD predictions and statistical analysis.
  • Keywords
    aerospace testing; avionics; electromagnetic compatibility; electromagnetic interference; radiation hardening (electronics); EM energy man-made sources; FDTD predictions; HIRF certification; aircraft fuselage HIRF penetration; electric field penetration; electromagnetic threat hardening; electronics systems upset; high intensity radiated fields; mode stirrer orientation; mode-stirred HIRF penetration scaled measurements; statistical analysis; Aerospace electronics; Aircraft; Certification; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Electromagnetic radiation; Frequency measurement; Laboratories; Monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Conference_Location
    Columbus, OH, USA
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1220383
  • Filename
    1220383