• DocumentCode
    1856412
  • Title

    Electronic and chemical properties of non-vacuum deposited chalcopyrite solar cells

  • Author

    Horsley, K. ; Pookpanratana, S. ; Krause, S. ; Hofmann, T. ; Blum, M. ; Weinhardt, L. ; Bär, M. ; George, K. ; Van Duren, J. ; Jackrel, D. ; Heske, C.

  • Author_Institution
    Dept. of Chem., Univ. of Nevada, Las Vegas, NV, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    We have investigated the electronic and chemical surface properties of a Cu(In1-xGax)Se2 (CIGSe) thin-film solar cell absorber and a CdS/CIGSe interface sample taken from Nanosolar´s manufacturing line. Using soft x-ray and UV photoelectron spectroscopy, inverse photoemission, and soft x-ray emission spectroscopy employing high-brilliance synchrotron radiation, we have determined the chemical composition of the surface and near-surface bulk, as well as some of the relevant electronic structure parameters (e.g., the surface band gap of the absorber). We find that the (previously air-exposed) surfaces show a surprisingly low degree of carbon-containing surface adsorbates, the presence of sodium and selenium oxide species on the surface of both samples, a significant S/Se intermixing at the CdS/CIGSe interface, and, as is common for high-efficiency CIGSe absorbers after surface cleaning, an electronic surface band gap (1.45 ± 0.15 eV) that is noticeably larger than the optical bulk band gap.
  • Keywords
    II-VI semiconductors; X-ray emission spectra; X-ray photoelectron spectra; cadmium compounds; copper compounds; gallium compounds; indium compounds; inverse photoemission spectroscopy; semiconductor thin films; solar absorber-convertors; solar cells; synchrotron radiation; ternary semiconductors; ultraviolet photoelectron spectra; CIGSe thin-film solar cell absorber; Cu(In1-xGax)Se2-CdS; Nanosolar manufacturing line; UV photoelectron spectroscopy; cadmium sulphide-CIGSe interface sample; carbon-containing surface adsorbates; chemical composition; chemical surface properties; electronic properties; electronic structure parameters; electronic surface band gap; high-brilliance synchrotron radiation; inverse photoemission spectroscopy; near-surface bulk; nonvacuum-deposited chalcopyrite solar cells; optical bulk band gap; selenium oxide; silicon-selenium intermixing; sodium oxide; soft x-ray emission spectroscopy; soft x-ray photoelectron spectroscopy; surface cleaning; Copper; Photonic band gap; Surface cleaning; Surface contamination; Three dimensional displays; Uninterruptible power systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6185972
  • Filename
    6185972