DocumentCode
1856427
Title
Synthesis of reliability models from behavioral-performance models
Author
Rao, Ramesh ; Swaminathan, Gnanasekaran ; Johnson, Barry W. ; Aylor, James H.
Author_Institution
Virginia Univ., Charlottesville, VA, USA
fYear
1994
fDate
24-27Jan 1994
Firstpage
292
Lastpage
297
Abstract
This paper presents a modeling methodology in which a design-engineer can specify a design using a single model which is capable of encapsulating both the performance and dependability characteristics of a system. The model used by the designer is a simulation-based model in which the behavior of the system under consideration is described using a predefined set of primitive modeling constructs. The behavior and characteristics of each primitive construct are defined by a colored Petri net (CPN) which provides an unambiguous mathematical specification of the construct. Further, each primitive construct has associated with it a VHSIC Hardware Description Language (VHDL) description which has a one-to-one correspondence with the CPN definition of the construct. The primitive constructs presented here provide a modular approach to system level modeling using CPNs. The key feature of the methodology is that a single model is used to study performance, reliability, and behavior. This methodology eliminates the problem of inconsistency between the different models used to perform high-level analysis and trade-offs. Using such an approach, the same model may be used to study the behavior of a system as well as evaluate its performance and reliability characteristics
Keywords
Petri nets; graph colouring; reliability theory; VHDL; VHSIC Hardware Description Language; behavioral-performance models; colored Petri net; dependability characteristics; design engineering; performance characteristics; reliability model synthesis; Control system synthesis; Data engineering; Design automation; Design engineering; Design methodology; Hardware design languages; Performance analysis; Petri nets; Reliability engineering; Very high speed integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1994. Proceedings., Annual
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-1786-6
Type
conf
DOI
10.1109/RAMS.1994.291123
Filename
291123
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