Title :
An ABCD parameter-based modeling and analysis of crosstalk induced effects in single-walled carbon nanotube bundle interconnects
Author :
Sahoo, Manodipan ; Ghosal, P. ; Rahaman, Hafizur
Author_Institution :
Dept. of Inf. Technol., Bengal Eng. & Sci. Univ., Shibpur, India
Abstract :
Single-walled carbon nanotubes (SWCNTs) have the potential to revolutionize the interconnects in future nanoscale integrated circuits. In the proposed work, crosstalk effects are investigated in SWCNTs at 21 nm and 15 nm technology nodes for intermediate as well as global interconnects. An ABCD parameter based approach has been used to investigate crosstalk delay and noise in both sparse as well as dense SWCNT bundled interconnect system. It is evident from the simulation results that the proposed model is not only 100% accurate but also almost 10 times faster than SPICE. The worst case crosstalk induced delay and peak crosstalk noise voltages for SWCNT bundle interconnects are compared to those of conventional copper (Cu) interconnects at the intermediate as well as global level interconnects. Simulation results also confirm that dense SWCNTs are always ahead of sparse SWCNTs with respect to performance advantage numbers over copper for every levels of interconnects and irrespective of technology nodes. As far as the worst case peak crosstalk noise is concerned, there is a critical length after which the performance of the dense SWCNT bundles is better than that of its sparse counterpart. Proposed model, analysis, along with supportive simulation results prove that dense SWCNT bundled interconnect is one of the most promising alterative interconnect solution for future generation of nanoscale circuits compared to copper with respect to performance as well as signal integrity issues.
Keywords :
SPICE; carbon nanotubes; copper; crosstalk; integrated circuit interconnections; integrated circuit noise; nanoelectronics; ABCD parameter based approach; ABCD parameter-based modeling; SPICE; SWCNT bundle interconnects; SWCNT bundled interconnect system; alterative interconnect solution; copper interconnects; crosstalk delay; crosstalk effects; crosstalk induced delay; crosstalk induced effects; dense SWCNT bundled interconnect; dense SWCNT bundles; global interconnects; global level interconnects; modeling analysis; nanoscale circuits; nanoscale integrated circuits; peak crosstalk noise voltages; signal integrity issues; single-walled carbon nanotube bundle interconnects; sparse SWCNT; technology nodes; worst case peak crosstalk noise; Copper; Crosstalk; Delays; Integrated circuit interconnections; Quantum capacitance; Resistance; ABCD parameter; Crosstalk; Delay; Global; Integrated Circuits; Interconnects; Intermediate; Nanoscale; Nanoscale Interconnect; Noise; SPICE; Single-walled Carbon Nanotube (SWCNT);
Conference_Titel :
Quality Electronic Design (ASQED), 2013 5th Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4799-1312-1
DOI :
10.1109/ASQED.2013.6643598