DocumentCode
1856481
Title
Analysis of impedance spectroscopy data: problems and new directions
Author
Macdonald, J.
Author_Institution
Dept. of Phys. & Astron., North Carolina Univ., Chapel Hill, NC, USA
fYear
1994
fDate
3-6 Nov 1994
Abstract
Summary form only given as follows: The author deals with the importance of analyzing impedance spectroscopy small-signal frequency-response data in ways which are appropriate to yield increased understanding of the underlying physico-chemical processes associated with the data and/or its use for process control and testing. Proper analysis requires complex nonlinear least squares fitting with appropriate weighting, and a well-developed computer program for such fitting is described. The value and power of such analysis is illustrated along with some of its problems. New analysis methods and interpretations are discussed which involve: (a) alternatives to Kronig-Kramers integral transformation; (b) new fitting models appropriate for solid materials; (c) ways of separating and understanding concomitant conduction-relaxation and dielectric-dispersion contributions to the overall response; and (d) estimation of distributions of relaxation times and barrier heights
Keywords
data analysis; electric impedance measurement; process control; reviews; spectroscopy; Kronig-Kramers integral transformation alternatives; appropriate weighting; barrier height; complex nonlinear least squares fitting; conduction-relaxation contribution; dielectric-dispersion contribution; fitting models; impedance spectroscopy data analysis; relaxation times distribution; small-signal frequency-response data; solid materials; testing; underlying physicochemical processes; well-developed computer program; Astronomy; Conducting materials; Dielectric materials; Electrochemical impedance spectroscopy; Frequency; Least squares methods; Physics; Process control; Solid modeling; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1994. Engineering Advances: New Opportunities for Biomedical Engineers. Proceedings of the 16th Annual International Conference of the IEEE
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-2050-6
Type
conf
DOI
10.1109/IEMBS.1994.412157
Filename
412157
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