Title :
Scalable multiresolution color image segmentation with smoothness constraint
Author :
Tab, Fardin Akhlaghian ; Naghdy, Golshah ; Mertins, Alfred
Author_Institution :
Sch. of Electr., Comput. & Telecommun. Eng., Wollongong Univ., NSW
Abstract :
This paper presents a multiresolution image segmentation method based on the discrete wavelet transform and Markov random field (MRF) modeling. A major contribution of this work is to add spatial scalability to the segmentation algorithm producing the same segmentation pattern at different resolutions. This property makes it applicable for scalable object-based wavelet coding. The correlation between different resolutions of pyramid is considered by a multire solution analysis which is incorporated into the objective function of the MRF segmentation algorithm. Examining the corresponding pixels at different resolutions simultaneously enables the algorithm to directly segment the images in the YUV or similar color spaces where luminance is in full resolution and chrominance components are at half resolution. Allowing for smoothness terms in the objective function at different resolutions improves border smoothness and creates visually more pleasing objects/regions, particularly at lower resolutions where downsampling distortions are more visible. In addition to spatial scalability, the proposed algorithm outperforms the standard single and multire solution segmentation algorithms, in both objective and subjective tests
Keywords :
Markov processes; discrete wavelet transforms; image colour analysis; image resolution; image segmentation; Markov random field modeling; border smoothness; color image segmentation; discrete wavelet transform; downsampling distortions; multire solution analysis; multiresolution image segmentation; segmentation algorithm; smoothness constraint; wavelet coding; Algorithm design and analysis; Color; Discrete wavelet transforms; Image resolution; Image segmentation; Markov random fields; Pixel; Scalability; Spatial resolution; Testing;
Conference_Titel :
Electro Information Technology, 2005 IEEE International Conference on
Conference_Location :
Lincoln, NE
Print_ISBN :
0-7803-9232-9
DOI :
10.1109/EIT.2005.1627039