Title :
On improving at no cost the quality of products built with SRAM-based FPGAs
Author :
Leveugle, R. ; Ben Jrad, Mohamed
Author_Institution :
TIMA Lab., Grenoble INP, Grenoble, France
Abstract :
Product or design quality encompasses many aspects. One of them is the robustness with respect to perturbations. This robustness depends on the implementation technology, but can also be improved at design time. This paper is focused on designs implemented in SRAM-based FPGAs that are sensitive to soft errors in the configuration memory. An approach is proposed to increase the dependability with respect to configuration errors, at no cost, by selectively hardening parts of the design. The selection of locally duplicated functions is made so that the protections take advantage of FPGA resources that would not be used by the implemented design. An automated design flow is presented for Xilinx Virtex V devices and fault injection results show that the design dependability may be noticeably enhanced. As an example, more than 40% of the LUTs used to implement a Leon3 Sparc v8 processor can be protected against multiple configuration errors with less than 20% resource overheads at the block level. The final system-level overhead may in many cases be null for a given product, either due to the discrete sizes of available FPGAs or to a different repartition of resource budget between system blocks.
Keywords :
SRAM chips; fault diagnosis; field programmable gate arrays; logic design; product design; product quality; FPGA resources; Leon3 Sparc v8 processor; SRAM-based FPGA; Xilinx Virtex V devices; automated design flow; configuration errors; configuration memory; design dependability; design quality; design time; fault injection; final system-level overhead; implementation technology; locally duplicated functions; product quality; resource budget; robustness; soft errors; Benchmark testing; Field programmable gate arrays; Microprocessors; Redundancy; Robustness; Routing; Table lookup; SRAM-based FPGA; dependability; multiple errors; soft errors;
Conference_Titel :
Quality Electronic Design (ASQED), 2013 5th Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4799-1312-1
DOI :
10.1109/ASQED.2013.6643603