DocumentCode :
1856659
Title :
Profiting from IoT: the key is very-large-scale happiness integration
Author :
Kazuo Yano ; Akitomi, Tomoaki ; Ara, Koji ; Watanabe, Junichiro ; Tsuji, Satomi ; Sato, Nobuo ; Hayakawa, Miki ; Moriwaki, Norihiko
Author_Institution :
R&D Group, Hitachi, Ltd., Kokubunji, Japan
fYear :
2015
fDate :
16-18 June 2015
Abstract :
Big data without link to value is merely a cost. We have studied how to profit from data with Internet-of-Things technologies for over 10 years to reach the answer: the Wearable Happiness Meter. It allows us to integrate the measure of both wellbeing and productivity of 7-billion people worldwide, which was the dream of the 18th-century philosopher Jeremy Bentham, numeration of the greatest happiness of the greatest number to measure the right and wrong. Knowing right and wrong with the 10x speed over conventional financial feedback accelerates the growth of the enterprise, the economy, and the individual to maximize the worldwide happiness. Here the integration is not only on a chip, but in the distributed massive chips embedded in the society.
Keywords :
Big Data; Internet of Things; Big Data; Internet-of-Things technologies; IoT; distributed massive chips; very-large-scale happiness integration; wearable happiness meter; Big data; Indexes; Organizations; Productivity; Reliability; Wearable sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology (VLSI Technology), 2015 Symposium on
Conference_Location :
Kyoto
ISSN :
0743-1562
Type :
conf
DOI :
10.1109/VLSIT.2015.7223631
Filename :
7223631
Link To Document :
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