Abstract :
The following topics are dealt with: RF testing; BIST; analog test; mixed-signal test; analog production test; test data compression; fault diagnosis; defect based testing; power aware test generation; SoC test; power aware scan test; memory self test; on-line test; and power aware delay testing.
Keywords :
analogue integrated circuits; built-in self test; fault diagnosis; integrated circuit testing; integrated memory circuits; logic design; low-power electronics; mixed analogue-digital integrated circuits; system-on-chip; BIST; RF testing; SoC test; analog production test; analog test; defect based testing; fault diagnosis; memory self test; mixed-signal test; on-line test; power aware delay testing; power aware scan test; power aware test generation; test data compression;
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
Print_ISBN :
978-0-7695-3396-4
