DocumentCode :
1856700
Title :
Implementation of statistical algorithms for international dependability-standards
Author :
Benski, Claudio
Author_Institution :
Merlin Gerin, Grenoble, France
fYear :
1994
fDate :
24-27Jan 1994
Firstpage :
366
Lastpage :
369
Abstract :
The Technical Committee 56 of the International Electrotechnical Commission (IEC) produces technical and management standards in the dependability field. As such, many of these documents are of statistical nature. Some recent controversy has arisen on whether such standards should be produced at all and why should international bodies, such as the IEC or ISO, waste valuable resources elaborating these standards. The purpose of this presentation is twofold: 1) we attempt to clarify the role and justification for the need of such standards, and 2) the criteria for the selection of algorithms included in statistical standards is defined in view of these needs
Keywords :
engineering; management; reliability; standards; IEC; International Electrotechnical Commission; Technical Committee 56; international dependability standards; justification; management standards; statistical standards; technical standards; Availability; Business; Contracts; Humans; IEC standards; ISO standards; Life testing; Maintenance; Merchandise; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1994. Proceedings., Annual
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1786-6
Type :
conf
DOI :
10.1109/RAMS.1994.291135
Filename :
291135
Link To Document :
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