DocumentCode
1856736
Title
Correlation between shock induced response duration and success of defibrillation
Author
Tovar, Oscar H. ; Bransford, Paris P. ; Moubarak, Jean B. ; Milne, Kevin B. ; Amanna, Ashwin E. ; Jones, Janice L.
Author_Institution
Dept. of Physiol. & Biophys., Georgetown Univ., Washington, DC, USA
fYear
1994
fDate
3-6 Nov 1994
Firstpage
21
Abstract
Although refractory period extension has been proposed as a basic mechanism for defibrillation, the relation between successful defibrillation and refractory period extension has not been determined. The authors tested the hypothesis that successful defibrillation correlates with longer shock induced responses compared with unsuccessful defibrillation. Sixty five episodes of fibrillation were induced in isolated rabbit hearts (n=5). After 10 seconds of fibrillation, defibrillation was attempted with 8 msec monophasic pulses (65% tilt) using epicardial patches. Action potentials were recorded with MAPs placed perpendicular to the shocking electrodes. Response duration measured from the beginning of the shock to maximal repolarization of the action potential was 96.5±14 msec during successful defibrillation and 54±25 msec during unsuccessful defibrillation (p<0.01). The authors´ results suggest that the extension of refractoriness by the defibrillating shock determines the success of defibrillation
Keywords
bioelectric phenomena; cardiology; defibrillators; electric shocks; patient treatment; 10 s; 8 to 96.5 ms; action potentials; defibrillation success; epicardial patches; isolated rabbit hearts; maximal repolarization; refractoriness extension; refractory period extension; shock induced response duration; successful defibrillation; unsuccessful defibrillation; Biophysics; Defibrillation; Electric shock; Electrodes; Heart; Myocardium; Physiology; Pulse measurements; Rabbits; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1994. Engineering Advances: New Opportunities for Biomedical Engineers. Proceedings of the 16th Annual International Conference of the IEEE
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-2050-6
Type
conf
DOI
10.1109/IEMBS.1994.412170
Filename
412170
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