DocumentCode
1856744
Title
Foreword
fYear
2008
fDate
24-27 Nov. 2008
Abstract
Presents the introductory welcome message from the conference proceedings.
Keywords
Africa; Circuit testing; Cities and towns; Conferences; Educational technology; Europe; Integrated circuit testing; Production; South America; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location
Sapporo
ISSN
1081-7735
Print_ISBN
978-0-7695-3396-4
Type
conf
DOI
10.1109/ATS.2008.4
Filename
4711543
Link To Document