Abstract :
Presents the introductory welcome message from the conference proceedings.
Keywords :
Africa; Circuit testing; Cities and towns; Conferences; Educational technology; Europe; Integrated circuit testing; Production; South America; System testing;
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
Print_ISBN :
978-0-7695-3396-4
