A transition based BIST technique for mixed-signal VLSI circuits

Author

Walker, Alvemon ; Lala, Parag K.

Author_Institution

Dept. of Electr. Eng., Tennessee Univ., Knoxville, TN, USA

fYear

1999

fDate

1999

Firstpage

33

Lastpage

35

Abstract

A new mixed-signal built-in self-test approach that is based upon voltage transitions at the primary output of the analog block under test (ABUT) is presented in this paper. This ABUT output is the pulse response of the ABUT for a rail-to-rail pulse stream. The technique can effectively detect both soft and hard faults and does not require an analog-to-digital converter (ADC) or/and digital-to-analog converter(DAC). This approach also does not require any additional analog circuits to realize the test signal generator and sample circuits. The paper is concluded with an example of the application of the proposed approach for a passive lowpass filter

Keywords

VLSI; built-in self test; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; hard faults; mixed-signal VLSI circuits; passive lowpass filter; primary output; pulse response; rail-to-rail pulse stream; sample circuits; soft faults; test signal generator; transition based BIST technique; voltage transitions; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Rail to rail outputs; Very large scale integration; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Design of Mixed-Mode Integrated Circuits and Applications, 1999. Third International Workshop on

Conference_Location

Puerto Vallarta

Print_ISBN

0-7803-5588-1

Type

conf

DOI

10.1109/MMICA.1999.833588

Filename

833588