DocumentCode
1856962
Title
Urban cell partitioning for improved statistical propagation modeling
Author
Smith, W.M. ; Cox, D.C.
Author_Institution
Dept. of Electr. Eng., Stanford Univ., CA, USA
Volume
4
fYear
2003
fDate
22-27 June 2003
Firstpage
896
Abstract
Urban environments present significant challenges to wireless system designers since radiated signals reflect off of buildings, cars, and other objects consisting of diverse materials and having very complex surfaces. Out of necessity, details of this environment are obscured so that a reasonably compact representation may be used to design and evaluate new systems. The continuum of models ranges from statistical models, which take into account only broad classifications of the propagation environment (dense urban, suburban, etc.), to ray-tracing methods, which require detailed knowledge of objects between transmitter and receiver. Taking the standard deviation of the prediction error as a measure of the model accuracy, one would expect the accuracy to improve as more information on the environment is folded into the model. In this paper, we discuss a modification to the traditional statistical models that significantly improves the estimation error with a minimal increase in complexity. Results are presented for measurements taken from the control channel of an active cellular base station transmitting at 880 MHz.
Keywords
UHF radio propagation; higher order statistics; log normal distribution; 880 MHz; active cellular base station; complex surfaces; cumulative distribution function; estimation error; least squares; log-normal distribution; minimal complexity increase; path-loss trend; small-scale variation; statistical propagation modeling; tall buildings; urban canyons; urban cell partitioning; Area measurement; Bandwidth; Base stations; Drives; Frequency shift keying; Portable computers; Predictive models; Sensor systems; Spectral analysis; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location
Columbus, OH, USA
Print_ISBN
0-7803-7846-6
Type
conf
DOI
10.1109/APS.2003.1220416
Filename
1220416
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