DocumentCode :
1857058
Title :
Efficient Low-Cost Testing of Wireless OFDM Polar Transceiver Systems
Author :
Lee, D. ; Natarajan, V. ; Senguttuvan, R. ; Chatterjee, A.
Author_Institution :
Sch. of ECE, Georgia Tech, Atlanta, GA
fYear :
2008
fDate :
24-27 Nov. 2008
Firstpage :
55
Lastpage :
60
Abstract :
Polar radio architectures are attractive due to the ability to implement them using largely digital architectures. However, testing for specs such as EVM incurs significant test time due to the large numbers of symbols that need to be transmitted. In our approach, EVM is modeled as a function of the system static non-idealities (IQ mismatch, gain, IIP3 parameters) and dynamic non-idealities (VCO phase noise). Using a multi-tone test stimulus, the static and dynamic non-idealities are estimated first. The data generated is used to predict EVM using machine learning methods with high accuracy while incurring minimal test time.
Keywords :
OFDM modulation; phase noise; telecommunication equipment testing; transceivers; voltage-controlled oscillators; EVM model; VCO phase noise; error vector magnitude; machine learning methods; polar radio architectures; wireless OFDM polar transceiver system; Circuit testing; Costs; Delta-sigma modulation; OFDM; Production; Radio frequency; Radio transmitters; System testing; Transceivers; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
ISSN :
1081-7735
Print_ISBN :
978-0-7695-3396-4
Type :
conf
DOI :
10.1109/ATS.2008.87
Filename :
4711559
Link To Document :
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