• DocumentCode
    1857148
  • Title

    An Extended Reliability Evaluation Framework for computer systems using fuzzy logic

  • Author

    Kumar, Anup ; Ragade, Rammohan K.

  • Author_Institution
    Louisville Univ., KY, USA
  • fYear
    1994
  • fDate
    24-27Jan 1994
  • Firstpage
    517
  • Lastpage
    522
  • Abstract
    Most existing reliability analyses provide a quantitative assessment of the overall system reliability assuming that the components of a system can operate only in two modes: completely operational or non-operational. We have developed an Extended Reliability Evaluation Framework (X-REF) to compute the system reliability in a quantitative form as well as in a qualitative form. In the extended framework, the components of a computer system can operate in any number of degraded modes of operation. The state of a component is given by a reliability profile which represents the component´s reliability values and their associated degree of certainty. The inputs needed for X-REF are component reliability profiles and the fault tree of the system. An effective technique is developed to combine these component reliability profiles using the fault tree as a configuration to represent system failure for computing the overall reliability profile of the system
  • Keywords
    failure analysis; fault tolerant computing; fuzzy logic; reliability; reliability theory; Extended Reliability Evaluation Framework; X-REF; completely operational mode; component reliability profiles; computer systems; degraded modes; degree of certainty; fault tree; fuzzy logic; nonoperational mode; overall system reliability; qualitative assessment; quantitative assessment; system failure; Computer network reliability; Computer networks; Degradation; Fault tolerance; Fault tolerant systems; Fault trees; Fuzzy logic; History; Maintenance; Performance evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1994. Proceedings., Annual
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1786-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1994.291159
  • Filename
    291159