Title :
A Reduced Code Linearity Test Method for Pipelined A/D Converters
Author :
Lin, Jin-Fu ; Kung, Te-Chieh ; Chang, Soon-Jyh
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan
Abstract :
In this work, a characteristic observation method is proposed to reduce the test time for the INL and DNL testing of a pipelined A/D converter. The symmetrical and specific regular rules are concluded by analyzing the characteristic of a pipelined ADC. As a result, based on the specific rules, only a few code bin widths of specific codes should be measured to accomplish the accurate full-code INL/DNL testing for a pipelined ADC. Simulation results show that the full-code INL/DNL performance of a 10-bit pipelined ADC can be characterized by measuring code bin widths of 33 codes only in our proposed method.
Keywords :
analogue-digital conversion; integrated circuit measurement; integrated circuit testing; DNL testing; INL testing; characteristic observation method; code bin width measurement; differential nonlinearity; integral nonlinearity; pipelined A/D converter; reduced code linearity test method; Costs; Error correction; Finite wordlength effects; Frequency measurement; Linearity; Logic circuits; Sampling methods; System identification; System testing; Time measurement; Analog-to-digital converter; DNL; INL; characteristic observation method; linearity testing;
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
Print_ISBN :
978-0-7695-3396-4
DOI :
10.1109/ATS.2008.53