Title :
20–140 keV X-ray sensitivity of GaAs detectors
Author :
Zarubin, A.N. ; Mokeev, D.Y. ; Tyazhev, A.V.
Author_Institution :
Tomsk State Univ., Tomsk
Abstract :
The paper presents results of experimental and theoretical investigations of 20-140 keV X-ray sensitivity of chromium compensated GaAs detectors.
Keywords :
III-V semiconductors; X-ray detection; X-ray imaging; chromium; gallium arsenide; semiconductor counters; Cr; GaAs; X-ray imaging system design; X-ray sensitivity; chromium compensated detector; electron volt energy 20 keV to 140 keV; gallium arsenide detector; Anodes; Cathodes; Chromium; Communication system control; Design optimization; Equations; Gallium arsenide; X-ray detection; X-ray detectors; X-ray imaging; Detector; GaAs; X-ray; sensitivity;
Conference_Titel :
Control and Communications, 2009. SIBCON 2009. International Siberian Conference on
Conference_Location :
Tomsk
Print_ISBN :
978-1-4244-2007-0
DOI :
10.1109/SIBCON.2009.5044855
