DocumentCode
1857240
Title
Higher Order Spectral (HOS) Analysis Of Epileptic EEG Signals
Author
Chua, K.C. ; Chandran, Vinod ; Acharya, R. ; Lim, C.M.
Author_Institution
Ngee Ann Polytech., Singapore
fYear
2007
fDate
22-26 Aug. 2007
Firstpage
6495
Lastpage
6498
Abstract
Epilepsy is a neurological condition, which affects the nervous system. Automatic seizure detection is very important in clinical practice and has to be achieved by analyzing the electroencephalogram (EEG). Seizures are the clinical manifestations of excessive and hypersynchronous activity of the neurons in the cerebral cortex and represent one of the most frequent malfunctions of the human central nervous system. Therefore, the search for precursors and predictors of a seizure in the human EEG is of utmost clinical relevance and may even lead to a deeper understanding of the seizure generating mechanisms. In this paper, the normal, pre-ictal (background) and ictal (epileptic) EEG signals are studied using higher order spectra. HOS based measures are shown to be able to distinguish epileptic EEG from normal and background EEG with high confident level ( p-value of less than 0.05).
Keywords
diseases; electroencephalography; feature extraction; medical signal processing; neurophysiology; spectral analysis; automatic seizure detection; central nervous system; cerebral cortex; clinical manifestation; electroencephalogram; epileptic EEG signals; feature extraction; higher order spectra; higher order spectral analysis; hypersynchronous activity; nervous system; neurological condition; seizure generating mechanisms; Analysis of variance; Electroencephalography; Entropy; Epilepsy; Event detection; Humans; Neurons; Signal analysis; Signal processing; Spectral analysis; EEG; Epilepsy; bicoherence; bispectrum; electroencephalogram; entropy; seizure; Analysis of Variance; Electroencephalography; Epilepsy; Humans;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location
Lyon
ISSN
1557-170X
Print_ISBN
978-1-4244-0787-3
Type
conf
DOI
10.1109/IEMBS.2007.4353847
Filename
4353847
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