Title :
Sneak circuit path within a DPDT relay
Author :
Rosenthal, Mark S. ; Mallette, Leo A. ; Ishikawa, Ken Y. ; Varney, Joel
Author_Institution :
Hughes Aircraft Co., Los Angeles, CA, USA
Abstract :
A failed resistor in an electronic circuit was found to have been subjected to an overvoltage condition. One side of the resistor was connected to a dual-coil DPDT latching relay, and the other side to ground. The cause of this failure was found to be due to a threefold problem: 1. A test set that, when powered on, would send simultaneous commands to both relay coils. 2. A sneak path through the relay when both relay coils were simultaneously energized. 3. A design that did not consider this sneak path
Keywords :
electrical faults; electron device testing; failure analysis; overvoltage; power supplies to apparatus; relays; DPDT relay; bistable latch; dual-coil DPDT latching relay; failed resistor; failure mode; relay coils; sneak circuit path; Coils; Electronic circuits; Latches; Power supplies; Pulse circuits; Pulsed power supplies; Relays; Resistors; Turning; Voltage control;
Conference_Titel :
Aerospace Applications Conference, 1994. Proceedings., 1994 IEEE
Conference_Location :
Vail, CO
Print_ISBN :
0-7803-1831-5
DOI :
10.1109/AERO.1994.291182
