DocumentCode :
1857482
Title :
Spin accumulation in FSF single electron transistor
Author :
Wang, Dawei ; Zhang, Manjiang ; Tateishi, Go ; Bergmann, Gerg ; Lu, Jia G.
Author_Institution :
Dept. of Electr. Eng., California Univ., USA
fYear :
2005
fDate :
11-15 July 2005
Firstpage :
271
Abstract :
The concept of spin accumulation has paved the way for future spin-based devices with important applications in information storage and quantum computing. Spin accumulation induced pair breaking in superconductor attributes to the conductance increase in ferromagnet-superconductor-ferromagnet single electron transistors when the magnetization of the two ferromagnetic leads change from parallel to antiparallel configurations. From theoretical simulation, it is found that the Meservey-Tedrow effect also causes a similar conductance change since the magnetic field changes the energy spectrum of the quasiparticles. Therefore, it is crucial to distinguish the two effects in the experiment. A key feature of the Meservey-Tedrow effect is that the conductance change shows opposite sign under reverse bias. Based on this, a transport measurement through double tunnel junctions is setup with proper bias configuration, thus separating the two effects and demonstrating that spin accumulation is attained.
Keywords :
ferromagnetism; magnetisation; single electron transistors; superconducting transistors; Meservey-Tedrow effect; bias configuration; conductance; double tunnel junctions; energy spectra; ferromagnet-superconductor-ferromagnet single electron transistor; information storage; magnetic field; magnetization; pair breaking; quantum computing; quasiparticles; reverse bias; spin accumulation; spin-based devices; transport measurement; Electrodes; Enhanced magnetoresistance; Magnetic field measurement; Magnetic tunneling; Magnetization; Polarization; Quantum computing; Single electron transistors; State feedback; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
Type :
conf
DOI :
10.1109/NANO.2005.1500748
Filename :
1500748
Link To Document :
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