DocumentCode :
1857620
Title :
Identification of high speed jittered digital interconnects using bicoherence spectra
Author :
Han, Kyungtae ; Tinsley, Keith R. ; Aguilar-Torrentera, J.
Author_Institution :
Intel Corp., Hillsboro, OR
fYear :
2008
fDate :
28-30 April 2008
Firstpage :
1
Lastpage :
4
Abstract :
Interference due to narrowband and broadband sources in mobile computing platforms have the capability to degrade overall wireless performance. Identification of these radio frequency interference (RFI) sources allows for mitigation and improved wireless performance. While shielding gives some immunity, interference sources operating within the same platform as sensitive radio receivers presents challenges far and above traditional electromagnetic compatibility (EMC) of device integration. In this paper, bicoherence, a signal processing analysis algorithm, is used to identify the presence of high-speed interconnects in radiated platform emissions. This paper uses a practical example of RFI found in current wireless platforms and shows that detection is feasible in Gaussian and non-Gaussian additive noise environments.
Keywords :
Gaussian noise; electromagnetic compatibility; interconnections; jitter; mobile computing; radio receivers; radiofrequency interference; Gaussian additive noise; bicoherence spectra; broadband sources; electromagnetic compatibility; high speed jittered digital interconnects; mobile computing platforms; narrowband sources; nonGaussian additive noise; radiated platform emissions; radio frequency interference; sensitive radio receivers; signal processing analysis algorithm; wireless performance; Degradation; Electromagnetic compatibility; Electromagnetic compatibility and interference; Immunity testing; Mobile computing; Narrowband; Radiofrequency identification; Radiofrequency interference; Signal processing algorithms; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Devices, Circuits and Systems, 2008. ICCDCS 2008. 7th International Caribbean Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-1956-2
Electronic_ISBN :
978-1-4244-1957-9
Type :
conf
DOI :
10.1109/ICCDCS.2008.4542625
Filename :
4542625
Link To Document :
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