Title :
Practical Challenges in Logic BIST Implementation Case Studies
Author :
Wu, Shianling ; Furukawa, Hiroshi ; Sheu, Boryau ; Wang, Laung-Terng ; Chao, Hao-Jan ; Yu, Lizhen ; Wen, Xiaoqing ; Murakami, Michio
Author_Institution :
SynTest Technol. Inc., Sunnyvale, CA
Abstract :
TurboBIST-Logic (TBL) is a software tool suite for incorporating logic built-in self-test (BIST) technology into digital Integrated Circuits and has been used by a variety of industrial designs globally since 2002. This abstract describes major features of TBL, and uses three industrial cases to show practical issues encountered and solved over the years. It also discusses an important new trend in going "hybrid," a flexible combination of capture-clocking schemes, with the goal to achieve an ever more optimal result over stand-alone schemes. Each of the three cases had its unique requirements for logic BIST, some needing to customize an existing solution, but all were set to achieve common BIST goals of at-speed testing, simple test interface to/from ATE, low test cost, high product reliability, and repeat testability investment reuse from IC, board, system, to in-field diagnosis.
Keywords :
automatic test pattern generation; built-in self test; integrated circuit testing; integrated logic circuits; logic testing; reliability; ATPG; TurboBIST-Logic software tool; at-speed testing; digital integrated circuits; logic built-in self-test technology; reliability; simple test interface; test cost; Built-in self-test; Computer industry; Digital integrated circuits; Integrated circuit technology; Integrated circuit testing; Logic circuits; Logic design; Logic testing; Software tools; System testing; Logic Built-In Self-Test;
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
Print_ISBN :
978-0-7695-3396-4
DOI :
10.1109/ATS.2008.59