DocumentCode
1857740
Title
Energy efficient 1-transistor active pixel sensor (APS) with FD SOI tunnel FET
Author
Dagtekin, Nilay ; Ionescu, Adrian Mihai
Author_Institution
Nanoelectronic Devices Lab., Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
fYear
2015
fDate
16-18 June 2015
Abstract
This paper presents the first energy efficient highly compact concept of active pixel sensor built with a single partially-gated tunnel FET (TFET). Experimental results show that the transistor characteristics of the investigated TFETs are nonlinearly modulated by optical excitation and a transistor gain that is a function of irradiance and bias conditions is reported for the first time. A memory effect is observed and exploited when the backgate is used as a secondary gate to control charge storing mechanism in the body, similarly to backside illuminated pixels. Compared to CMOS, 1T-TFET pixel offers high sensitivity (detection limit <; 2pW/μm2 in visible light), low power operation, improved temperature stability (validation at 70°C) and high compactness (1T architecture with pixel size of ~10×1μm2 in this work).
Keywords
field effect transistors; image sensors; low-power electronics; phototransistors; silicon-on-insulator; FD SOI tunnel FET; energy efficient active pixel sensor; one-transistor active pixel sensor; partially gated tunnel; temperature 70 C; temperature stability; CMOS integrated circuits; Hysteresis; Lighting; Logic gates; Optical saturation; Optical sensors; Transistors; FD SOI; Photogate; active pixel sensor; optoelectronic devices; phototransistor; tunnel FET;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology (VLSI Technology), 2015 Symposium on
Conference_Location
Kyoto
ISSN
0743-1562
Type
conf
DOI
10.1109/VLSIT.2015.7223681
Filename
7223681
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